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Beilstein J. Nanotechnol. 2012, 3, 778–788, doi:10.3762/bjnano.3.87
Figure 1: (a) Top camera view of the cantilever and the scratch on the film (delimited with the dashed lines)...
Figure 2: Calculation of the film thickness by the full-indentation method. The dashed lines show the tip-fil...
Figure 3: Thickness of (PLL/HA)n as a function of n as measured by scratch-and-scan and full-indentation meth...
Figure 4: (a) A typical force–indentation depth curve as measured by CP-AFM on (PLL/HA)24. The jump point of ...
Figure 5: Relative percentage Young’s modulus E% for (PLL/HA)72 as measured on one fixed spot. All the values...
Figure 6: Calculated Young’s modulus E for (PLL/HA)72 with different indentation velocities sorted by (a) the...
Figure 7: Young’s modulus E as a function of (PLL/HA)n bilayer number n for an indenter radius of 2.37 μm (op...
Figure 8: A summary of the stress-relaxation measurements. “Start of dwell” is the indentation depth at which...
Figure 9: Stress relaxation curve with a dwell time of 40 s. The biexponential fit is represented by the thic...
Figure 10: The cantilever’s stress relaxation time τ1 and τ2 as a function of the initial indentation velocity...